2004NASA Technical Reports Server (NASA)Requires access

Design of Amphoteric Refraction Models Using WAVICA and RAYICA

Richard Su

Open publisher page 0 citations

Abstract

The phenomenon of refraction of light is due to refractive index mismatches in two different media. However, to achieve this effect, a finite reflection loss is inevitable. A recent finding presented a unique type of interface, ferroelastic materials, that enables refraction without any reflection for either an electron or a light beam. This property is called total refraction. The same type of interface that yields total refraction can also yield amphoteric refraction, where the index of refraction can be either positive or negative depending on the incident angle. This interface could potentially be used to steer light without reflections which could have major applications in high power optics. My goal this summer is to first familiarize myself with the Mathematica software, especially the Wavica and Rayica packages. I will then model the amphoteric refraction by either modifying the Wavica and Rayica packages or using the built-in functions in these packages.

About this research paper

What this paper is about

The phenomenon of refraction of light is due to refractive index mismatches in two different media. However, to achieve this effect, a finite reflection loss is inevitable. A recent finding presented a unique type of interface, ferroelastic materials, that enables refraction without any reflection for either an electron or a light beam. This property is called total refraction. The same type of interface that yields total refraction can also yield amphoteric refraction, where the index of refraction can be either positive or negative depending on the incident angle. This interface could potentially be used to steer light without reflections which could have major applications in high power optics. My goal this summer is to first familiarize myself with the Mathematica software, especially the Wavica and Rayica packages. I will then model the amphoteric refraction by either modifying the Wavica and Rayica packages or using the built-in functions in these packages.

Why it matters

A significance statement is not available in the OpenAlex record.

Key contribution

A contribution statement is not available in the OpenAlex record.

Method / approach

Method details are not available in the OpenAlex metadata.

Main findings

Findings are not separately available in the OpenAlex metadata.

Limitations

Limitations are not available in the OpenAlex metadata.

Applications

Application details are not available in the OpenAlex metadata.

Available abstract

The phenomenon of refraction of light is due to refractive index mismatches in two different media. However, to achieve this effect, a finite reflection loss is inevitable. A recent finding presented a unique type of interface, ferroelastic materials, that enables refraction without any reflection for either an electron or a light beam. This property is called total refraction. The same type of interface that yields total refraction can also yield amphoteric refraction, where the index of refraction can be either positive or negative depending on the incident angle. This interface could potentially be used to steer light without reflections which could have major applications in high power optics. My goal this summer is to first familiarize myself with the Mathematica software, especially the Wavica and Rayica packages. I will then model the amphoteric refraction by either modifying the Wavica and Rayica packages or using the built-in functions in these packages.

Key concepts: Refraction, Total external reflection, Refractive index, Optics, Reflection (computer programming), X-ray optics, Total internal reflection, Interface (matter)

Related papers

Back to paper searchBrowse research topicsOriginal source
Design of Amphoteric Refraction Models Using WAVICA and RAYICA — Research Paper | ScholarLens