2020•Journal of Mechanical Science and TechnologyRequires access

Fault analysis of CNC equipment based on DEMATEL/ISM/ANP

Sun Shuguang, Zhou Wenjie, Meng Zhang, Liu Xiyu, Mou Xiaowan

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Key concepts: Reliability (semiconductor), Reliability engineering, Fault (geology), Relation (database), Process (computing), Engineering, Mechanism (biology), Numerical control

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