1991Proceedings annual meeting Electron Microscopy Society of AmericaRequires access

Microanalysis with a 200keV FEG TEM

David C. Joy

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Abstract

Introduction The Hitachi HF-2000 is a 200keV cold field emitter TEM, designed to offer both high resolution imaging performance and a nanometer probe-forming mode for microanalytical operation. The purpose of this paper is to report some initial microanalytical results obtained from the HF-2000 installed at the University of Tennessee. General Electron-Optical Parameters The cold field emission gun, which runs at about 5x10-9pA pressure, uses an electrostatic lens configuration and a six stage accelerator. The entire electron gun system is under the control of a dedicated microprocessor which permits all of the operational parameters of the gun to be set, monitored, and adjusted through a keyboard and display. The tip emission current can be adjusted up to 40μA, and the gun voltage ratio (that is the ratio between the voltage on the second anode and the tip extraction voltage) can be varied from 4.5 to 7.5, permitting a significant degree of flexibility in optimizing the optics of the emitter.

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Introduction The Hitachi HF-2000 is a 200keV cold field emitter TEM, designed to offer both high resolution imaging performance and a nanometer probe-forming mode for microanalytical operation. The purpose of this paper is to report some initial microanalytical results obtained from the HF-2000 installed at the University of Tennessee. General Electron-Optical Parameters The cold field emission gun, which runs at about 5x10-9pA pressure, uses an electrostatic lens configuration and a six stage accelerator. The entire electron gun system is under the control of a dedicated microprocessor which permits all of the operational parameters of the gun to be set, monitored, and adjusted through a keyboard and display. The tip emission current can be adjusted up to 40μA, and the gun voltage ratio (that is the ratio between the voltage on the second anode and the tip extraction voltage) can be varied from 4.5 to 7.5, permitting a significant degree of flexibility in optimizing the optics of the emitter.

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Available abstract

Introduction The Hitachi HF-2000 is a 200keV cold field emitter TEM, designed to offer both high resolution imaging performance and a nanometer probe-forming mode for microanalytical operation. The purpose of this paper is to report some initial microanalytical results obtained from the HF-2000 installed at the University of Tennessee. General Electron-Optical Parameters The cold field emission gun, which runs at about 5x10-9pA pressure, uses an electrostatic lens configuration and a six stage accelerator. The entire electron gun system is under the control of a dedicated microprocessor which permits all of the operational parameters of the gun to be set, monitored, and adjusted through a keyboard and display. The tip emission current can be adjusted up to 40μA, and the gun voltage ratio (that is the ratio between the voltage on the second anode and the tip extraction voltage) can be varied from 4.5 to 7.5, permitting a significant degree of flexibility in optimizing the optics of the emitter.

Key concepts: Electron gun, Field emission gun, Common emitter, Acceleration voltage, Field electron emission, Lens (geology), Voltage, Cathode

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