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Nano-optical probe in a scanning near-field optical microscope (SNOM)

Sumio Hosaka, Toshimiti Shintani, Kenchi Itoh, Atsushi Kikukawa, Masaru Muranishi

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Key concepts: Near-field scanning optical microscope, Optical microscope, Optics, Microscope, Materials science, Near-field optics, Physics, Scanning electron microscope

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