1998•Unpublished venueRequires access

Optical properties of Er-doped silicon rich silicon oxide(SRSO) films deposited by electron cyclotron resonance-plasma enhanced chemical vapor deposition(ECR-PECVD) = ECR PECVD 방법으로 증착한 Er 이 도핑된 SRSO 박막에서의 광학적 특성연구

Se-Young Seo, 서세영

Open publisher page 0 citations

Abstract

This record does not include an abstract. Use the full-text link above if available.

About this research paper

What this paper is about

An abstract is not available in the OpenAlex record for this paper.

Why it matters

A significance statement is not available in the OpenAlex record.

Key contribution

A contribution statement is not available in the OpenAlex record.

Method / approach

Method details are not available in the OpenAlex metadata.

Main findings

Findings are not separately available in the OpenAlex metadata.

Limitations

Limitations are not available in the OpenAlex metadata.

Applications

Application details are not available in the OpenAlex metadata.

Key concepts: Plasma-enhanced chemical vapor deposition, Electron cyclotron resonance, Chemical vapor deposition, Silicon oxide, Silicon, Materials science, Doping, Plasma

Back to paper searchBrowse research topicsOriginal source
Optical properties of Er-doped silicon rich silicon oxide(SRSO) films deposited by electron cyclotron resonance-plasma enhanced chemical vapor deposition(ECR-PECVD) = ECR PECVD 방법으로 증착한 Er 이 도핑된 SRSO 박막에서의 광학적 특성연구 — Research Paper | ScholarLens