1985•Journal of Non-Crystalline SolidsRequires access

Structural study of amorphous Al0.20As0.50Te0.30, Al0.10As0.40Te0.50 and Al0.10As0.20Te0.70 by x-ray diffraction (I)

J. J. del Val, L. Esquivias, Pedro Luis Olano, F. Sanz

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Key concepts: Tetrahedron, Quenching (fluorescence), Amorphous solid, Radial distribution function, Diffraction, Atom (system on chip), Materials science, Crystallography

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Structural study of amorphous Al0.20As0.50Te0.30, Al0.10As0.40Te0.50 and Al0.10As0.20Te0.70 by x-ray diffraction (I) — Research Paper | ScholarLens