2011Analele Universităţii Maritime ConstanţaRequires access

The Determination of the Semiconductor Materials Characteristics

George Căruntu

Open publisher page 0 citations

Abstract

The Hall devices may be used as magnetic sensors, or as tools for exploring the properties of the applied materials. In this paper are presented specific methods and adequate experimental devices that on the basis of the Hall effect allow the determination of the relevant semiconductors material characteristics, at the same time to avoid errors due to parasitic effects. It is also emphasised the influence of the constructive imperfection of the measuring devices on the accuracy of the results.

About this research paper

What this paper is about

The Hall devices may be used as magnetic sensors, or as tools for exploring the properties of the applied materials. In this paper are presented specific methods and adequate experimental devices that on the basis of the Hall effect allow the determination of the relevant semiconductors material characteristics, at the same time to avoid errors due to parasitic effects. It is also emphasised the influence of the constructive imperfection of the measuring devices on the accuracy of the results.

Why it matters

A significance statement is not available in the OpenAlex record.

Key contribution

A contribution statement is not available in the OpenAlex record.

Method / approach

Method details are not available in the OpenAlex metadata.

Main findings

Findings are not separately available in the OpenAlex metadata.

Limitations

Limitations are not available in the OpenAlex metadata.

Applications

Application details are not available in the OpenAlex metadata.

Available abstract

The Hall devices may be used as magnetic sensors, or as tools for exploring the properties of the applied materials. In this paper are presented specific methods and adequate experimental devices that on the basis of the Hall effect allow the determination of the relevant semiconductors material characteristics, at the same time to avoid errors due to parasitic effects. It is also emphasised the influence of the constructive imperfection of the measuring devices on the accuracy of the results.

Key concepts: Semiconductor device, Hall effect, Semiconductor materials, Semiconductor, Constructive, Hall effect sensor, Computer science, Engineering physics

Related papers

Back to paper searchBrowse research topicsOriginal source
The Determination of the Semiconductor Materials Characteristics — Research Paper | ScholarLens