The Determination of the Semiconductor Materials Characteristics
George Căruntu
Abstract
George Căruntu
Abstract
The Hall devices may be used as magnetic sensors, or as tools for exploring the properties of the applied materials. In this paper are presented specific methods and adequate experimental devices that on the basis of the Hall effect allow the determination of the relevant semiconductors material characteristics, at the same time to avoid errors due to parasitic effects. It is also emphasised the influence of the constructive imperfection of the measuring devices on the accuracy of the results.
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The Hall devices may be used as magnetic sensors, or as tools for exploring the properties of the applied materials. In this paper are presented specific methods and adequate experimental devices that on the basis of the Hall effect allow the determination of the relevant semiconductors material characteristics, at the same time to avoid errors due to parasitic effects. It is also emphasised the influence of the constructive imperfection of the measuring devices on the accuracy of the results.
Key concepts: Semiconductor device, Hall effect, Semiconductor materials, Semiconductor, Constructive, Hall effect sensor, Computer science, Engineering physics