2012•Microscopy and MicroanalysisRequires access

Low Accelerating Voltage, X-ray Microanalysis: Benefits and Challenges

Peter L. McSwiggen, Namiko Mori, T. Ohta, C. Nielsen

Open publisher page 2 citations

Abstract

Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

About this research paper

What this paper is about

Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

Why it matters

OpenAlex reports 2 citations for this work. Citation counts describe recorded attention and do not establish research quality.

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Method / approach

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Available abstract

Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

Key concepts: Microanalysis, Phoenix, Materials science, X-ray, Analytical Chemistry (journal), Nanotechnology, Chemistry, Optics

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