2019Unpublished venueRequires access

A 15 – 34 GHz Robust GaN based Low-Noise Amplifier with 0.8dB Minimum Noise Figure

Shiyong Zhang, Penghui Zheng, Jianxing Xu, Rong Wang, Yang Huang, Xiaodong Tong

Open publisher page 11 citations

Abstract

In this report, a broad band (15 GHz to 34 GHz) low noise amplifier using 100 nm GaN on silicon technology is designed and fabricated. The LNA shows an extremely low noise figure of 1.2 dB and small signal gain of 18.5±1.5 dB across the bandwidth. The LNA can work in the drain bias from 3.5 V to 8 V without increasing the noise figure. The chip size is 2 mm × 1.3 mm. The robustness of the LNA is also tested by stressing the working LNA with a continuous-wave input power, no significant degradation is observed.

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What this paper is about

In this report, a broad band (15 GHz to 34 GHz) low noise amplifier using 100 nm GaN on silicon technology is designed and fabricated. The LNA shows an extremely low noise figure of 1.2 dB and small signal gain of 18.5±1.5 dB across the bandwidth. The LNA can work in the drain bias from 3.5 V to 8 V without increasing the noise figure. The chip size is 2 mm × 1.3 mm. The robustness of the LNA is also tested by stressing the working LNA with a continuous-wave input power, no significant degradation is observed.

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OpenAlex reports 11 citations for this work. Citation counts describe recorded attention and do not establish research quality.

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Available abstract

In this report, a broad band (15 GHz to 34 GHz) low noise amplifier using 100 nm GaN on silicon technology is designed and fabricated. The LNA shows an extremely low noise figure of 1.2 dB and small signal gain of 18.5±1.5 dB across the bandwidth. The LNA can work in the drain bias from 3.5 V to 8 V without increasing the noise figure. The chip size is 2 mm × 1.3 mm. The robustness of the LNA is also tested by stressing the working LNA with a continuous-wave input power, no significant degradation is observed.

Key concepts: Low-noise amplifier, Noise figure, Amplifier, Noise-figure meter, Materials science, Optoelectronics, Bandwidth (computing), Robustness (evolution)

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