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Precision and Reliability of 40Ar/39Ar Dating of Thin Tephra in Lacustrine Paleoclimate Archives

Andreas G.N. Bergner, Alan L. Deino

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Key concepts: Tephra, Paleoclimatology, Geology, Paleontology, Reliability (semiconductor), Absolute dating, Tephrochronology, Archaeology

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Precision and Reliability of 40Ar/39Ar Dating of Thin Tephra in Lacustrine Paleoclimate Archives — Research Paper | ScholarLens