2019•Microelectronics JournalRequires access

Double cell upsets mitigation through triple modular redundancy

Yuan‐Qing Li, Anselm Breitenreiter, Marko S. Andjelkovic, Junchao Chen, Milan Babic, Milos D. Krstic

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Key concepts: Triple modular redundancy, Soft error, Redundancy (engineering), Modular design, Digital electronics, Error detection and correction, Electronic engineering, Embedded system

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