A Study on NDE technique using Acoustic Reflection Microscope
Geon Moon, Dae-Sik Ko, Jang-Gwon Kim, Gye-Seok Jun
Abstract
Geon Moon, Dae-Sik Ko, Jang-Gwon Kim, Gye-Seok Jun
Abstract
In this paper, the characteristic response of reflected signals of acoustic reflection microscope, V(z) phenomenon, has been studied and a new type of NDE technique has been presented. 10 Won coin, aluminium, IC component, and kevlar-epoxy samples have been used for the experiment of NDE and the acoustic microscope operating at a center frequency of 3 MHz has been used in the focused or defocused mode of operation. In experiment, it has been shown that the acoustic microscope has the resolution of and the defects present on the surface and near surface of samples have been detected by acoustic transducer and imaged on a monitor, and the variation of the contrast of image for samples has been in good agreement with V(z) phenomenon.
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In this paper, the characteristic response of reflected signals of acoustic reflection microscope, V(z) phenomenon, has been studied and a new type of NDE technique has been presented. 10 Won coin, aluminium, IC component, and kevlar-epoxy samples have been used for the experiment of NDE and the acoustic microscope operating at a center frequency of 3 MHz has been used in the focused or defocused mode of operation. In experiment, it has been shown that the acoustic microscope has the resolution of and the defects present on the surface and near surface of samples have been detected by acoustic transducer and imaged on a monitor, and the variation of the contrast of image for samples has been in good agreement with V(z) phenomenon.
Key concepts: Microscope, Scanning acoustic microscope, Acoustic microscopy, Materials science, Reflection (computer programming), Optics, Acoustics, Transducer