Improved Electromagnetic Compatibility Standards for the Interconnected Wireless World
Marc Pous, Marco A. Azpúrua, Ferran Silva
Abstract
Marc Pous, Marco A. Azpúrua, Ferran Silva
Abstract
The future is wireless, a world where everything is interconnected. However, the current standards for ensuring the electromagnetic compatibility (EMC) and the coexistence of such wireless systems urge for a major update. It is shown how novel statistical approaches based on the amplitude probability distribution detector and time-domain measurements are better suited for estimating the degradation caused by electromagnetic interferences on digital communication systems than the established practice of determining compliance according to the quasi-peak detector levels using a pass/fail criterion. Therefore, a redefinition of the test methods and of the compliance requirements in terms of EMC standards must be a priority of the international standardization bodies. Finally, a discussion of the fundamental challenges involved in this standardization breakthrough for EMC is delivered.
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The future is wireless, a world where everything is interconnected. However, the current standards for ensuring the electromagnetic compatibility (EMC) and the coexistence of such wireless systems urge for a major update. It is shown how novel statistical approaches based on the amplitude probability distribution detector and time-domain measurements are better suited for estimating the degradation caused by electromagnetic interferences on digital communication systems than the established practice of determining compliance according to the quasi-peak detector levels using a pass/fail criterion. Therefore, a redefinition of the test methods and of the compliance requirements in terms of EMC standards must be a priority of the international standardization bodies. Finally, a discussion of the fundamental challenges involved in this standardization breakthrough for EMC is delivered.
Key concepts: Electromagnetic compatibility, Standardization, Wireless, Detector, Reliability engineering, Computer science, Electronic engineering, Compatibility (geochemistry)