Reliability model of disk arrays RAID-5 with data striping
P A Rahman, G D'K Novikova Freyre Shavier
Abstract
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P A Rahman, G D'K Novikova Freyre Shavier
Abstract
Open-access reader
Within the scope of the this scientific paper, the simplified reliability model of disk arrays RAID-5 (redundant arrays of inexpensive disks) and an advanced reliability model offered by the authors taking into the consideration nonzero time of the faulty disk replacement and different failure rates of disks in normal state of the disk array and in degraded and rebuild states are discussed. The formula obtained by the authors for calculation of the mean time to data loss (MTTDL) of the RAID-5 disk arrays on basis of the advanced model is also presented. Finally, the technique of estimation of the initial reliability parameters, which are used in the reliability model, and the calculation examples of the mean time to data loss of the RAID-5 disk arrays for the different number of disks are also given.
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Within the scope of the this scientific paper, the simplified reliability model of disk arrays RAID-5 (redundant arrays of inexpensive disks) and an advanced reliability model offered by the authors taking into the consideration nonzero time of the faulty disk replacement and different failure rates of disks in normal state of the disk array and in degraded and rebuild states are discussed. The formula obtained by the authors for calculation of the mean time to data loss (MTTDL) of the RAID-5 disk arrays on basis of the advanced model is also presented. Finally, the technique of estimation of the initial reliability parameters, which are used in the reliability model, and the calculation examples of the mean time to data loss of the RAID-5 disk arrays for the different number of disks are also given.
Key concepts: RAID, Data striping, Disk array, Reliability (semiconductor), Computer science, Reliability engineering, State (computer science), Parallel computing