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2019•Unpublished venueRequires access

Combining Total Internal Reflection Fluorescence Microscopy with Rapid Super-resolution Imaging

Min Yi Guo, Panagiotis Chandris, John Paul Giannini, Jiji Chen, Harshad D. Vishwasrao, Hari Shroff

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Abstract

We combined instant structured illumination microscopy and total internal reflection fluorescence microscopy (instant TIRF-SIM), enabling rapid super-resolution imaging (down to 115±13 nm) at acquisition speeds up to 100 Hz in living samples.

About this research paper

What this paper is about

We combined instant structured illumination microscopy and total internal reflection fluorescence microscopy (instant TIRF-SIM), enabling rapid super-resolution imaging (down to 115±13 nm) at acquisition speeds up to 100 Hz in living samples.

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Available abstract

We combined instant structured illumination microscopy and total internal reflection fluorescence microscopy (instant TIRF-SIM), enabling rapid super-resolution imaging (down to 115±13 nm) at acquisition speeds up to 100 Hz in living samples.

Key concepts: Total internal reflection fluorescence microscope, Microscopy, Total internal reflection, Resolution (logic), Optics, Light sheet fluorescence microscopy, Fluorescence microscope, Materials science

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