2019•Journal of Nanoscience and NanotechnologyRequires access

Resistive Switching Mechanism of HfO2 Based Resistance Random Access Memory Devices with Different Electrode Materials

Chao Sun, Songhe Lu, Fang Jin, Wenqin Mo, Junlei Song, Kaifeng Dong

Open publisher page 0 citations

Abstract

This study investigated the impact of electrode materials on HfO₂-based RRAM devices. The research includes three types of electrode materials: (1) the electrodes with strong ability of oxygen reservoirs; (2) the electrode with poor ability of oxygen reservoirs; (3) the active electrode with injection ability. Through implementing different combinations of electrodes, three types of switching modes were obtained and the relative conduction mechanism was analyzed, as well as conduction model. Those studies may offer ways of using electrodes to control the resistive switching processes and fabricating the RRAM devices with good performance.

About this research paper

What this paper is about

This study investigated the impact of electrode materials on HfO₂-based RRAM devices. The research includes three types of electrode materials: (1) the electrodes with strong ability of oxygen reservoirs; (2) the electrode with poor ability of oxygen reservoirs; (3) the active electrode with injection ability. Through implementing different combinations of electrodes, three types of switching modes were obtained and the relative conduction mechanism was analyzed, as well as conduction model. Those studies may offer ways of using electrodes to control the resistive switching processes and fabricating the RRAM devices with good performance.

Why it matters

A significance statement is not available in the OpenAlex record.

Key contribution

A contribution statement is not available in the OpenAlex record.

Method / approach

Method details are not available in the OpenAlex metadata.

Main findings

Findings are not separately available in the OpenAlex metadata.

Limitations

Limitations are not available in the OpenAlex metadata.

Applications

Application details are not available in the OpenAlex metadata.

Available abstract

This study investigated the impact of electrode materials on HfO₂-based RRAM devices. The research includes three types of electrode materials: (1) the electrodes with strong ability of oxygen reservoirs; (2) the electrode with poor ability of oxygen reservoirs; (3) the active electrode with injection ability. Through implementing different combinations of electrodes, three types of switching modes were obtained and the relative conduction mechanism was analyzed, as well as conduction model. Those studies may offer ways of using electrodes to control the resistive switching processes and fabricating the RRAM devices with good performance.

Key concepts: Materials science, Resistive random-access memory, Electrode, Mechanism (biology), Optoelectronics, Resistive touchscreen, Random access memory, Non-volatile memory

Related papers

Back to paper searchBrowse research topicsOriginal source
Resistive Switching Mechanism of HfO2 Based Resistance Random Access Memory Devices with Different Electrode Materials — Research Paper | ScholarLens