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2017•bioRxiv (Cold Spring Harbor Laboratory)Open access

Single-shot super-resolution total internal reflection fluorescence microscopy

Min Guo, Panagiotis Chandris, John Giannini, Adam Trexler, Robert Fischer, Jiji Chen, Harshad D. Vishwasrao, Ivan Rey‐Suarez, Yicong Wu, Clare M. Waterman, George H. Patterson, Arpita Upadhyaya, Justin W. Taraska, Hari Shroff

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Abstract

Abstract We demonstrate a simple method for combining instant structured illumination microscopy (SIM) with total internal reflection fluorescence microscopy (TIRF), doubling the spatial resolution of TIRF (down to 115 +/-13 nm) and enabling imaging frame rates up to 100 Hz over hundreds of time points. We apply instant TIRF-SIM to multiple live samples, achieving rapid, high contrast super-resolution imaging in close proximity to the coverslip surface.

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Abstract We demonstrate a simple method for combining instant structured illumination microscopy (SIM) with total internal reflection fluorescence microscopy (TIRF), doubling the spatial resolution of TIRF (down to 115 +/-13 nm) and enabling imaging frame rates up to 100 Hz over hundreds of time points. We apply instant TIRF-SIM to multiple live samples, achieving rapid, high contrast super-resolution imaging in close proximity to the coverslip surface.

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Available abstract

Abstract We demonstrate a simple method for combining instant structured illumination microscopy (SIM) with total internal reflection fluorescence microscopy (TIRF), doubling the spatial resolution of TIRF (down to 115 +/-13 nm) and enabling imaging frame rates up to 100 Hz over hundreds of time points. We apply instant TIRF-SIM to multiple live samples, achieving rapid, high contrast super-resolution imaging in close proximity to the coverslip surface.

Key concepts: Total internal reflection fluorescence microscope, Microscopy, Resolution (logic), Optics, Total internal reflection, Reflection (computer programming), Light sheet fluorescence microscopy, Materials science

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