2019Electronics LettersOpen access

Implantable CMOS image sensor with incident‐angle‐selective pixels

Kenji Sugie, Kiyotaka Sasagawa, Mark Christian Guinto, Makito Haruta, Takashi Tokuda, Jun Ohta

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Abstract

Angle‐selective pixels fabricated by using metal layers of the image sensor chip are proposed. Four incident‐angle‐selective pixels share one aperture. The selective pixel has a peak at 40° and full width at half maximum of ∼23°. An image sensor composed of normal and angle‐sensitive pixels was designed and fabricated. The reconstruction of a high‐resolution image from the blurred image using five different views is demonstrated.

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Angle‐selective pixels fabricated by using metal layers of the image sensor chip are proposed. Four incident‐angle‐selective pixels share one aperture. The selective pixel has a peak at 40° and full width at half maximum of ∼23°. An image sensor composed of normal and angle‐sensitive pixels was designed and fabricated. The reconstruction of a high‐resolution image from the blurred image using five different views is demonstrated.

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Available abstract

Angle‐selective pixels fabricated by using metal layers of the image sensor chip are proposed. Four incident‐angle‐selective pixels share one aperture. The selective pixel has a peak at 40° and full width at half maximum of ∼23°. An image sensor composed of normal and angle‐sensitive pixels was designed and fabricated. The reconstruction of a high‐resolution image from the blurred image using five different views is demonstrated.

Key concepts: Pixel, Image sensor, Dot pitch, Chip, CMOS sensor, Optics, Image resolution, Materials science

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