Characterizations of continuous univariate probability distributions with applications to goodness-of-fit testing
Steffen Betsch, Bruno Ebner
Abstract
Steffen Betsch, Bruno Ebner
Abstract
By extrapolating the explicit formula of the zero-bias distribution occurring in the context of Stein's method, we construct characterization identities for a large class of absolutely continuous univariate distributions. Instead of trying to derive characterizing distributional transformations that inherit certain structures for the use in further theoretic endeavours, we focus on explicit representations given through a formula for the distribution function. The results we establish with this ambition feature immediate applications in the area of goodness-of-fit testing. We draw up a blueprint for the construction of tests of fit that include procedures for many distributions for which little (if any) practicable tests are known.
A significance statement is not available in the OpenAlex record.
A contribution statement is not available in the OpenAlex record.
Method details are not available in the OpenAlex metadata.
Findings are not separately available in the OpenAlex metadata.
Limitations are not available in the OpenAlex metadata.
Application details are not available in the OpenAlex metadata.
By extrapolating the explicit formula of the zero-bias distribution occurring in the context of Stein's method, we construct characterization identities for a large class of absolutely continuous univariate distributions. Instead of trying to derive characterizing distributional transformations that inherit certain structures for the use in further theoretic endeavours, we focus on explicit representations given through a formula for the distribution function. The results we establish with this ambition feature immediate applications in the area of goodness-of-fit testing. We draw up a blueprint for the construction of tests of fit that include procedures for many distributions for which little (if any) practicable tests are known.
Key concepts: Univariate, Goodness of fit, Mathematics, Context (archaeology), Probability distribution, Class (philosophy), Econometrics, Statistics