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2017•White Rose Research Online (University of Leeds, The University of Sheffield, University of York)Open access

Aberration Corrected Transmission Electron Microscopy

Thomas Walther, Rafal E. Dunin‐Borkowski, Jean‐Luc Rouvière, Eric A. Stach

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Key concepts: Transmission electron microscopy, Electron microscope, Optics, Microscopy, Transmission (telecommunications), Conventional transmission electron microscope, Materials science, Scanning transmission electron microscopy

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