201114th Conference on Mesoscale Processes/15th Conference on Aviation, Range, and Aerospace MeteorologyRequires access

Sensitivity of parameterized dust emissions to model resolution

Mark Waylonis

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Key concepts: Sensitivity (control systems), Environmental science, Parameterized complexity, Resolution (logic), Atmospheric sciences, Remote sensing, Meteorology, Computer science

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Sensitivity of parameterized dust emissions to model resolution — Research Paper | ScholarLens