2013•Unpublished venueRequires access

ENLARGING THE SURFACE AREA OF MONOLAYER GRAPHENE SYNTHESIZED BY MECHANICAL EXFOLIATION

Gagik Shmavonyan, G. G. Sevoyan, V. M. Aroutiounian

Open publisher page 19 citations

Abstract

A method of enlarging the surface area of monolayer graphene produced by mechanical exfoliation of graphite and increasing the possibility of obtaining monolayer graphene is suggested. The enlargement of the surface area of monolayer graphene is due to additionally cleaving few layer grapheme adjacent to the monolayer. Raman spectroscopy and atomic force microscopy (AFM) are used to characterize as-prepared and enlarged areas of monolayer graphene and distinguish it from few layer graphene and graphite.

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What this paper is about

A method of enlarging the surface area of monolayer graphene produced by mechanical exfoliation of graphite and increasing the possibility of obtaining monolayer graphene is suggested. The enlargement of the surface area of monolayer graphene is due to additionally cleaving few layer grapheme adjacent to the monolayer. Raman spectroscopy and atomic force microscopy (AFM) are used to characterize as-prepared and enlarged areas of monolayer graphene and distinguish it from few layer graphene and graphite.

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OpenAlex reports 19 citations for this work. Citation counts describe recorded attention and do not establish research quality.

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Available abstract

A method of enlarging the surface area of monolayer graphene produced by mechanical exfoliation of graphite and increasing the possibility of obtaining monolayer graphene is suggested. The enlargement of the surface area of monolayer graphene is due to additionally cleaving few layer grapheme adjacent to the monolayer. Raman spectroscopy and atomic force microscopy (AFM) are used to characterize as-prepared and enlarged areas of monolayer graphene and distinguish it from few layer graphene and graphite.

Key concepts: Monolayer, Graphene, Exfoliation joint, Graphite, Raman spectroscopy, Materials science, Graphene oxide paper, Atomic force microscopy

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