Phase-shifting profilometer resolution limit estimation via modulation transfer function analysis
Ritz Ann Aguilar, Maricor Soriano
Abstract
Ritz Ann Aguilar, Maricor Soriano
Abstract
This study aims to find both lateral and depth resolution limit of a phase-shifting profilometry (PSP) system by investigating the effect of its modulation transfer function (MTF) as a function of the sinusoidal fringe frequency on the resolution of its output image. Upon finding the resolution limit via MTF analysis, the result is verified experimentally through the 3D reconstruction of a test object with known dimensions. This allows deeper insight on how the combination of system parameters and MTF affect the overall depth and lateral resolution of a phase-shifting profilometer. This also gives the user a prior knowledge of which optical component/s should be used for a desired application.
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This study aims to find both lateral and depth resolution limit of a phase-shifting profilometry (PSP) system by investigating the effect of its modulation transfer function (MTF) as a function of the sinusoidal fringe frequency on the resolution of its output image. Upon finding the resolution limit via MTF analysis, the result is verified experimentally through the 3D reconstruction of a test object with known dimensions. This allows deeper insight on how the combination of system parameters and MTF affect the overall depth and lateral resolution of a phase-shifting profilometer. This also gives the user a prior knowledge of which optical component/s should be used for a desired application.
Key concepts: Profilometer, Optical transfer function, Optics, Limit (mathematics), Phase (matter), Spatial frequency, Transfer function, Resolution (logic)