2017•Microelectronics ReliabilityRequires access

Probabilistic fatigue damage estimation of embedded electronic solder joints under random vibration

Mayssam Jannoun, Younès Aoues, Emmanuel Pagnacco, Philippe Pougnet, Abdelkhalak El Hami

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Key concepts: Random vibration, Vibration fatigue, Vibration, Structural engineering, Soldering, Reliability (semiconductor), Finite element method, Probabilistic logic

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