2008•The proceedings of the JSME annual meetingOpen access

1512 Evaluation of defect detection for a guided wave excited by the efficient generation method using the reflector

Keiji Ogura, Hironori KONDO, Kenichi Yoshida, Hideo Nishino

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Abstract

The authors have been recently shown a novel method of an efficient generation and detection method using the wave reflector located near the sensors. The maximum efficiency have reached three times the larger than the normal method without the reflector. In this paper, experiments with and without the reflector were carried out to evaluate the two methods. The sensitivity of the method with the reflector was two times the larger than that without the reflector when the cross-sectional loss was larger than 1%. Conversely, when the loss was smaller than 1%, it was not confirmed obvious differences between the two methods.

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What this paper is about

The authors have been recently shown a novel method of an efficient generation and detection method using the wave reflector located near the sensors. The maximum efficiency have reached three times the larger than the normal method without the reflector. In this paper, experiments with and without the reflector were carried out to evaluate the two methods. The sensitivity of the method with the reflector was two times the larger than that without the reflector when the cross-sectional loss was larger than 1%. Conversely, when the loss was smaller than 1%, it was not confirmed obvious differences between the two methods.

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Available abstract

The authors have been recently shown a novel method of an efficient generation and detection method using the wave reflector located near the sensors. The maximum efficiency have reached three times the larger than the normal method without the reflector. In this paper, experiments with and without the reflector were carried out to evaluate the two methods. The sensitivity of the method with the reflector was two times the larger than that without the reflector when the cross-sectional loss was larger than 1%. Conversely, when the loss was smaller than 1%, it was not confirmed obvious differences between the two methods.

Key concepts: Reflector (photography), Optics, Sensitivity (control systems), Excited state, Materials science, Physics, Electronic engineering, Engineering

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