2016•The Japan Society of Applied PhysicsRequires access

Atomic Force Microscopy Measurement on In/Si(111)-8×2 surface

Kota Iwata, Shiro Yamazaki, Akitoshi Shiotari, Yoshiaki Sugimoto

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Key concepts: Materials science, Atomic force microscopy, Kelvin probe force microscope, Photoconductive atomic force microscopy, Conductive atomic force microscopy, Microscopy, Surface (topology), Nanotechnology

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