2015•Springer series in surface sciencesRequires access
Defects on Bulk MgO(001) Imaged by nc-AFM
Clemens Barth
Open publisher page 4 citations
Abstract
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Clemens Barth
Abstract
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OpenAlex reports 4 citations for this work. Citation counts describe recorded attention and do not establish research quality.
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Key concepts: Kelvin probe force microscope, Atomic force microscopy, Microscopy, Materials science, Resolution (logic), Force spectroscopy, Electrostatic force microscope, Nanotechnology