1995•Unpublished venueRequires access

General Reliability and Intraclass Correlation Program (GRIP)

Ron D. Hays, Eric Yu I. Wang, Michael S. Sonksen

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Key concepts: Intraclass correlation, Reliability (semiconductor), Correlation, Statistics, Reliability engineering, Computer science, Mathematics, Engineering

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General Reliability and Intraclass Correlation Program (GRIP) — Research Paper | ScholarLens