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Single-Event Upset and Soft Error Rate in Power ArchitectureTM microprocessors

D. Bellin, Raoul Velazco, Paul Peronnard, Michel Pignol, R. Ecoffet, Dan Alexandrescu, Donald R. Gauthier

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Available abstract

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Key concepts: Soft error, Single event upset, Upset, Computer science, Power (physics), Event (particle physics), Reliability engineering, Computer hardware

Single-Event Upset and Soft Error Rate in Power ArchitectureTM microprocessors

About this research paper

What this paper is about

Why it matters

Key contribution

Method / approach

Main findings

Limitations

Applications

Available abstract

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