2017•Journal of Nanoscience and NanotechnologyRequires access

Optical and Structural Characterization of Dislocations in GaN Epitaxial Layers

Yong Choon Park, Mi‐Yang Kim, Young Joon Yoon

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Key concepts: Materials science, Characterization (materials science), Epitaxy, Optoelectronics, Crystallography, Nanotechnology, Layer (electronics), Chemistry

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Optical and Structural Characterization of Dislocations in GaN Epitaxial Layers — Research Paper | ScholarLens