2017Conference on Lasers and Electro-OpticsRequires access

Metal Assisted Focused-Ion Beam Etching for High-Fidelity Fabrication of Nanophotonic Devices

Akash Kannegulla, Li‐Jing Cheng

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Abstract

We report an MAFIB technique that significantly improves the fidelity of nanofabrication that allows direct milling of nanostructures on various materials with fine edges and smooth surfaces. The technique supports precise fabrication of nanophotonic devices.

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What this paper is about

We report an MAFIB technique that significantly improves the fidelity of nanofabrication that allows direct milling of nanostructures on various materials with fine edges and smooth surfaces. The technique supports precise fabrication of nanophotonic devices.

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Available abstract

We report an MAFIB technique that significantly improves the fidelity of nanofabrication that allows direct milling of nanostructures on various materials with fine edges and smooth surfaces. The technique supports precise fabrication of nanophotonic devices.

Key concepts: Nanolithography, Nanophotonics, Fabrication, Etching (microfabrication), Materials science, Nanotechnology, Nanostructure, Focused ion beam

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