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Polymer surface analysis by Atomic Force microscopy in Pulsed Force Mode

Olivier Soppera, Christiane P. Carre

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Key concepts: Atomic force microscopy, Polymer, Materials science, Atomic force acoustic microscopy, Conductive atomic force microscopy, Magnetic force microscope, Kelvin probe force microscope, Non-contact atomic force microscopy

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Polymer surface analysis by Atomic Force microscopy in Pulsed Force Mode — Research Paper | ScholarLens