Dephasing rates for weak localization and universal conductance fluctuations in two dimensional Si:P and Ge:P δ-layers
Saquib Shamim, Suddhasatta Mahapatra, Giordano Scappucci, W. M. Klesse, M. Y. Simmons, Arindam Ghosh
Abstract
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Saquib Shamim, Suddhasatta Mahapatra, Giordano Scappucci, W. M. Klesse, M. Y. Simmons, Arindam Ghosh
Abstract
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Abstract We report quantum transport measurements on two dimensional (2D) Si:P and Ge:P δ-layers and compare the inelastic scattering rates relevant for weak localization (WL) and universal conductance fluctuations (UCF) for devices of various doping densities (0.3–2.5 × 1018 m−2) at low temperatures (0.3–4.2 K). The phase breaking rate extracted experimentally from measurements of WL correction to conductivity and UCF agree well with each other within the entire temperature range. This establishes that WL and UCF, being the outcome of quantum interference phenomena, are governed by the same dephasing rate.
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Abstract We report quantum transport measurements on two dimensional (2D) Si:P and Ge:P δ-layers and compare the inelastic scattering rates relevant for weak localization (WL) and universal conductance fluctuations (UCF) for devices of various doping densities (0.3–2.5 × 1018 m−2) at low temperatures (0.3–4.2 K). The phase breaking rate extracted experimentally from measurements of WL correction to conductivity and UCF agree well with each other within the entire temperature range. This establishes that WL and UCF, being the outcome of quantum interference phenomena, are governed by the same dephasing rate.
Key concepts: Dephasing, Weak localization, Conductance, Condensed matter physics, Scattering, Phase (matter), Quantum interference, Range (aeronautics)