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2008•Journal of Insect Science (Ludhiana)Requires access

Estimation of yield losses in wheat due to wheat aphids at different population levels.

Paramjit Singh, Sanehdeep Kaur, Vijay Kumar, Harsharn Singh, Dulcha Singh Brar

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Key concepts: Yield (engineering), Agronomy, Population, Estimation, Russian wheat aphid, Winter wheat, Environmental science, Mathematics

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