Assessing Nanofabrication Performance Based on the Estimated Taguchi Capability Index with Subsamples

The Taguchi capability index C_(pm) has been proposed to the manufacturing industry for measuring manufacturing capability. Investigations of the estimated Taguchi capability index based on subsamples have been proposed and arrested substantial research attention. In this paper, investigation based on subsamples is considered for normally distributed processes from the traditional distribution frequency approach. A reliable inferential procedure based on subsamples of the estimated Taguchi capability index is proposed. Computational programs using Matlab software are proposed to calculate p-values and critical values required to ensure the process reaching a certain desirable level of the time. A practical example is provided to demonstrate how the proposed procedure may be applied for judging whether the process runs under the desirable quality requirement.