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2017•Scripta MaterialiaRequires access

Assessment of elemental distributions at line and planar defects in Cu(In,Ga)Se2 thin films by atom probe tomography

Oana Cojocaru‐Mirédin, Torsten Schwarz, Daniel Abou‐Ras

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Key concepts: Atom probe, Planar, Materials science, Atom (system on chip), Tomography, Transmission electron microscopy, Thin film, Nanometre

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