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1999•Journal of the Japan Institute of Metals and MaterialsOpen access

Characterization of Microstructure and Magnetic Domain Structure in Sm-Co Based Permanent Magnets by Advanced Transmission Electron Microscopy

Jun-Mo Yang, Daisuke Shindo, Masaki Takeguchi, Masahiro Kawasaki, Tetsuo Oikawa

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Abstract

Microstructure and magnetic domain structure of Sm(Co0.653Fe0.257Cu0.066Zr0.024)7.3-permanent magnets were investigated by advanced transmission electron microscopy (TEM), using techniques such as high-resolution electron microscopy (HREM) and Lorentz electron microscopy with a high-voltage electron microscope, and an elemental mapping method utilizing a small electron probe with a field-emission electron gun. As a result, the crystallographic arrangement of cellular microstructures including the Z phase and the composition distribution in the cell boundary phase were accurately evaluated. Also, the magnetic domain wall width was precisely measured from the intensity distribution of Lorentz electron microscope images recorded with the imaging plate. Furthermore, the magnetic field in both the inside and the outside of this material was observed by an electron holography technique for the first time.

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Microstructure and magnetic domain structure of Sm(Co0.653Fe0.257Cu0.066Zr0.024)7.3-permanent magnets were investigated by advanced transmission electron microscopy (TEM), using techniques such as high-resolution electron microscopy (HREM) and Lorentz electron microscopy with a high-voltage electron microscope, and an elemental mapping method utilizing a small electron probe with a field-emission electron gun. As a result, the crystallographic arrangement of cellular microstructures including the Z phase and the composition distribution in the cell boundary phase were accurately evaluated. Also, the magnetic domain wall width was precisely measured from the intensity distribution of Lorentz electron microscope images recorded with the imaging plate. Furthermore, the magnetic field in both the inside and the outside of this material was observed by an electron holography technique for the first time.

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Available abstract

Microstructure and magnetic domain structure of Sm(Co0.653Fe0.257Cu0.066Zr0.024)7.3-permanent magnets were investigated by advanced transmission electron microscopy (TEM), using techniques such as high-resolution electron microscopy (HREM) and Lorentz electron microscopy with a high-voltage electron microscope, and an elemental mapping method utilizing a small electron probe with a field-emission electron gun. As a result, the crystallographic arrangement of cellular microstructures including the Z phase and the composition distribution in the cell boundary phase were accurately evaluated. Also, the magnetic domain wall width was precisely measured from the intensity distribution of Lorentz electron microscope images recorded with the imaging plate. Furthermore, the magnetic field in both the inside and the outside of this material was observed by an electron holography technique for the first time.

Key concepts: Electron holography, Transmission electron microscopy, Field emission gun, Energy filtered transmission electron microscopy, Microstructure, Electron tomography, Materials science, Electron microscope

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