2005•MRS ProceedingsRequires access

Atomic Force Microscopy Probe with Integrated Loop and Shielded Leads for Micromagnetic Sensing

D. P. Lagally, A. Karbassi, Y. Wang, C. A. Paulson, Daniel W. van der Weide

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Key concepts: Magnetic resonance force microscopy, Magnetic force microscope, Materials science, Magnetic resonance microscopy, Kelvin probe force microscope, Cantilever, Atomic force acoustic microscopy, Atomic force microscopy

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