2011•Bulletin of the American Physical SocietyRequires access

Electron Profile Stiffness and Critical Gradient Studies in an L-mode Discharge in DIII-D

J.C. DeBoo, K.H. Burrell, C.C. Petty, S.P. Smith, A. E. White, C. Holland, E. J. Doyle, J. C. Hillesheim, T. L. Rhodes, L. Schmitz, G. Wang, L. Zeng, G.R. McKee

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Key concepts: DIII-D, Electron, Stiffness, Mode (computer interface), Materials science, Plasma, Physics, Atomic physics

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