Procedures for treating common cause failures in safety and reliability studies: Volume 2, Analytic background and techniques: Final report
Ali Mosleh, K.N. Fleming, G.W. Parry, H.M. Paula, D.H. Worledge, D.M. Rasmuson
Abstract
Ali Mosleh, K.N. Fleming, G.W. Parry, H.M. Paula, D.H. Worledge, D.M. Rasmuson
Abstract
This report presents a framework for the inclusion of the impact of common cause failures in risk and reliability evaluations. Common cause failures are defined as that subset of dependent failures for which causes are not explicitly included in the logic model as basic events. The emphasis here is on providing procedures for a practical, systematic approach that can be used to perform and clearly document the analysis. The framework and the methods discussed for performing the different stages of the analysis integrate insights obtained from engineering assessments of the system and the historical evidence from multiple failure events into a systematic, reproducible, and defensible analysis. This document, Volume 2, contains a series of appendices that provide additional background and methodological detail on several important topics discussed in Volume 1.
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This report presents a framework for the inclusion of the impact of common cause failures in risk and reliability evaluations. Common cause failures are defined as that subset of dependent failures for which causes are not explicitly included in the logic model as basic events. The emphasis here is on providing procedures for a practical, systematic approach that can be used to perform and clearly document the analysis. The framework and the methods discussed for performing the different stages of the analysis integrate insights obtained from engineering assessments of the system and the historical evidence from multiple failure events into a systematic, reproducible, and defensible analysis. This document, Volume 2, contains a series of appendices that provide additional background and methodological detail on several important topics discussed in Volume 1.
Key concepts: Reliability (semiconductor), Computer science, Reliability engineering, Common cause failure, Volume (thermodynamics), Risk analysis (engineering), Common cause and special cause, Data mining