2017International Journal of Advanced ResearchOpen access

SCREENING OF RESISTANCE SOURCE AGAINST SPOT BLOTCH DISEASE CAUSED BY BIPOLARIS SOROKINIANA IN TRITICUM AESTIVUM L.

Ashish Ojha, Gyanendra Singh, BhudevSingh Tyagi, Virender Pratap Singh, A Rajita, Pradeep Kumar

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Abstract

One hundred spring wheat genotypes/ germplasm (Triticum aestivum L.) lines related to Indian, CIMMYT, and Chinese were evaluated for spot blotch tolerance against natural epiphytotic conditions, caused

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One hundred spring wheat genotypes/ germplasm (Triticum aestivum L.) lines related to Indian, CIMMYT, and Chinese were evaluated for spot blotch tolerance against natural epiphytotic conditions, caused

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Available abstract

One hundred spring wheat genotypes/ germplasm (Triticum aestivum L.) lines related to Indian, CIMMYT, and Chinese were evaluated for spot blotch tolerance against natural epiphytotic conditions, caused

Key concepts: Bipolaris, Biology, Resistance (ecology), Veterinary medicine, Research centre, Leaf spot, Horticulture, Agronomy

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SCREENING OF RESISTANCE SOURCE AGAINST SPOT BLOTCH DISEASE CAUSED BY BIPOLARIS SOROKINIANA IN TRITICUM AESTIVUM L. — Research Paper | ScholarLens