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2017•Journal of Electronic MaterialsRequires access

Measuring the Minority-Carrier Diffusion Length of n-Type In0.53Ga0.47As Epilayers Using Surface Photovoltage

Ping Li, Hengjing Tang, Tao Li, L. Xue, Xiumei Shao, T. Pavelka, Li Huang, Haimei Gong

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Key concepts: Surface photovoltage, Carrier lifetime, Diffusion, Materials science, Wafer, Photoconductivity, Doping, Analytical Chemistry (journal)

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Measuring the Minority-Carrier Diffusion Length of n-Type In0.53Ga0.47As Epilayers Using Surface Photovoltage — Research Paper | ScholarLens