2016Microscopy and MicroanalysisOpen access

Atomic Scale Analysis of Dopants in CMOS Structures by Atom Probe Tomography

Isabelle Martin, Robert Estivill, M. Juhel, Adeline Grenier, Ty J. Prosa, David J. Larson

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Abstract

Isabelle Martin, Robert Estivill, Marc Juhel, Adeline Grenier, Ty J Prosa, David J Larson; Atomic Scale Analysis of Dopants in CMOS Structures by Atom Prob

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Isabelle Martin, Robert Estivill, Marc Juhel, Adeline Grenier, Ty J Prosa, David J Larson; Atomic Scale Analysis of Dopants in CMOS Structures by Atom Prob

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Available abstract

Isabelle Martin, Robert Estivill, Marc Juhel, Adeline Grenier, Ty J Prosa, David J Larson; Atomic Scale Analysis of Dopants in CMOS Structures by Atom Prob

Key concepts: Atom probe, Dopant, Atomic units, Materials science, Atom (system on chip), CMOS, Scale (ratio), Optoelectronics

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