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Evaluation of the Millimeter-Wave Characteristics of Dielectric Substrates by using Whispering Gallery Mode Resonators

Yoshinori Kogami, Takashi Shimizu, Satoru Osawa, Naoaki Abe

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Abstract

The Whispering-gallery mode dielectric resonator method has been developed to measure the complex permittivities of dielectric substrate materials at millimeter wave frequencies. The measurement principle, measurement apparatus, system, and some examples of measured results are presented in this manuscript.

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What this paper is about

The Whispering-gallery mode dielectric resonator method has been developed to measure the complex permittivities of dielectric substrate materials at millimeter wave frequencies. The measurement principle, measurement apparatus, system, and some examples of measured results are presented in this manuscript.

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Available abstract

The Whispering-gallery mode dielectric resonator method has been developed to measure the complex permittivities of dielectric substrate materials at millimeter wave frequencies. The measurement principle, measurement apparatus, system, and some examples of measured results are presented in this manuscript.

Key concepts: Whispering-gallery wave, Resonator, Extremely high frequency, Dielectric, Whispering gallery, Millimeter, Dielectric resonator, Materials science

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Evaluation of the Millimeter-Wave Characteristics of Dielectric Substrates by using Whispering Gallery Mode Resonators — Research Paper | ScholarLens