Evaluation of the Millimeter-Wave Characteristics of Dielectric Substrates by using Whispering Gallery Mode Resonators
Yoshinori Kogami, Takashi Shimizu, Satoru Osawa, Naoaki Abe
Abstract
Yoshinori Kogami, Takashi Shimizu, Satoru Osawa, Naoaki Abe
Abstract
The Whispering-gallery mode dielectric resonator method has been developed to measure the complex permittivities of dielectric substrate materials at millimeter wave frequencies. The measurement principle, measurement apparatus, system, and some examples of measured results are presented in this manuscript.
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The Whispering-gallery mode dielectric resonator method has been developed to measure the complex permittivities of dielectric substrate materials at millimeter wave frequencies. The measurement principle, measurement apparatus, system, and some examples of measured results are presented in this manuscript.
Key concepts: Whispering-gallery wave, Resonator, Extremely high frequency, Dielectric, Whispering gallery, Millimeter, Dielectric resonator, Materials science