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2003•Unpublished venueRequires access

Solving ESD protection latch-up guard ring issues during electrostatic discharge (ESD) events

David Trémouilles, Bafleur, Bertrand, Nolhier, Mauran, Lescouzeres

Open publisher page 2 citations

Abstract

In this paper, we show how latch-up guard rings, surrounding electrostatic discharge (ESD) protection devices, can reduce the overall performance of the ESD protection network. This issue is addressed by TCAD simulation and experimental results. Design guidelines to cope with this problem are proposed.

About this research paper

What this paper is about

In this paper, we show how latch-up guard rings, surrounding electrostatic discharge (ESD) protection devices, can reduce the overall performance of the ESD protection network. This issue is addressed by TCAD simulation and experimental results. Design guidelines to cope with this problem are proposed.

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OpenAlex reports 2 citations for this work. Citation counts describe recorded attention and do not establish research quality.

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Available abstract

In this paper, we show how latch-up guard rings, surrounding electrostatic discharge (ESD) protection devices, can reduce the overall performance of the ESD protection network. This issue is addressed by TCAD simulation and experimental results. Design guidelines to cope with this problem are proposed.

Key concepts: Electrostatic discharge, Guard (computer science), Electrical engineering, Computer science, Electronic engineering, Engineering, Materials science, Voltage

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