Temperature dependence of absolute CsI(Tl) scintillation yield
J.D. Valentine, David K. Wehe, G. Knoll, C.E. Moss
Abstract
J.D. Valentine, David K. Wehe, G. Knoll, C.E. Moss
Abstract
A 1 cm*1 cm right cylindrical CsI(Tl) crystal was mounted on a 1 cm*1 cm square photodiode to measure the absolute scintillation yield of CsI(Tl) between -80 degrees C and 50 degrees C. A maximum yield of 65900+or-3300 photons/MeV was measured at 36 degrees C. While the scintillation yield at -80 degrees C is about 57% of the maximum, the yield is approximately constant in the range of -15 to 40 degrees C, at an average of 64600+or-3200 photons/MeV. Consideration is also given to the temperature dependence of the scintillation decay time, the scintillation emission spectrum, and the wavelength-dependent photodiode quantum efficiency.>
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A 1 cm*1 cm right cylindrical CsI(Tl) crystal was mounted on a 1 cm*1 cm square photodiode to measure the absolute scintillation yield of CsI(Tl) between -80 degrees C and 50 degrees C. A maximum yield of 65900+or-3300 photons/MeV was measured at 36 degrees C. While the scintillation yield at -80 degrees C is about 57% of the maximum, the yield is approximately constant in the range of -15 to 40 degrees C, at an average of 64600+or-3200 photons/MeV. Consideration is also given to the temperature dependence of the scintillation decay time, the scintillation emission spectrum, and the wavelength-dependent photodiode quantum efficiency.>
Key concepts: Scintillation, Yield (engineering), Quantum yield, Photodiode, Scintillation counter, Photon, Physics, Wavelength