2012Unpublished venueRequires access

Resistive switching in high-k dielectrics for non-volatile memory applications

R. G. Elliman, M. N. Saleh, Dinesh Kumar Venkatachalam, Tae Hee Kim, Kidane Belay, Fouad Karouta

Open publisher page 1 citations

Abstract

We review our recent research on resistive switching in transition metal oxides for use as nonvolatile resistive random access memory (ReRAM), including the effect of film microstructure on switching characteristics and new data on metal-bridge memory.

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What this paper is about

We review our recent research on resistive switching in transition metal oxides for use as nonvolatile resistive random access memory (ReRAM), including the effect of film microstructure on switching characteristics and new data on metal-bridge memory.

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OpenAlex reports 1 citations for this work. Citation counts describe recorded attention and do not establish research quality.

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Available abstract

We review our recent research on resistive switching in transition metal oxides for use as nonvolatile resistive random access memory (ReRAM), including the effect of film microstructure on switching characteristics and new data on metal-bridge memory.

Key concepts: Resistive random-access memory, Non-volatile memory, Materials science, Resistive touchscreen, Dielectric, Random access memory, Optoelectronics, Data retention

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