2014Unpublished venueRequires access

High level modeling of physical layer noise parameters using SystemC

Prem Kumar Lohani, K Ranjani, Ravi Shankar, C Sundaresan, C V S Chaitanya

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Abstract

SystemVerilog and SystemC are extensively used for design and Verification in VLSI industry. This paper propose a method to combine SystemVerilog and SystemC code in a single hardware/software simulation which allows design teams to leverage abstract representations of system function as it increases system simulations speed. Both languages interoperate through an intermediate layer of abstraction known as Transaction Level Models (TLMs). This paper develops Universal Verification Methodology (UVM) TLM environment for SV and SC communication in the system modeling.

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What this paper is about

SystemVerilog and SystemC are extensively used for design and Verification in VLSI industry. This paper propose a method to combine SystemVerilog and SystemC code in a single hardware/software simulation which allows design teams to leverage abstract representations of system function as it increases system simulations speed. Both languages interoperate through an intermediate layer of abstraction known as Transaction Level Models (TLMs). This paper develops Universal Verification Methodology (UVM) TLM environment for SV and SC communication in the system modeling.

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Available abstract

SystemVerilog and SystemC are extensively used for design and Verification in VLSI industry. This paper propose a method to combine SystemVerilog and SystemC code in a single hardware/software simulation which allows design teams to leverage abstract representations of system function as it increases system simulations speed. Both languages interoperate through an intermediate layer of abstraction known as Transaction Level Models (TLMs). This paper develops Universal Verification Methodology (UVM) TLM environment for SV and SC communication in the system modeling.

Key concepts: SystemC, Transaction-level modeling, Computer science, Electronic system-level design and verification, Chaining, Computer architecture, Embedded system, Leverage (statistics)

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