2016Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIERequires access

Data processing for a multi-slit LWIR HSI spectrometer

Jacob A. Martin, Joseph Meola

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Abstract

Preliminary testing of a three-slit prism-based spectrometer is presented to test means of exploiting data from a multi-slit spectrometer as well as some potential ways of dealing with complications that arise when using multiple slits. When using a multiple slit spectrometer to boost SNR there are two primary concerns: first, the spectral axis of each slit must be nearly identical to effective average and second, the image from each slit must be well-registered. Based on some of these complications it seems, given the current technology, the best operational mode is to use the sensor to increase area coverage.

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What this paper is about

Preliminary testing of a three-slit prism-based spectrometer is presented to test means of exploiting data from a multi-slit spectrometer as well as some potential ways of dealing with complications that arise when using multiple slits. When using a multiple slit spectrometer to boost SNR there are two primary concerns: first, the spectral axis of each slit must be nearly identical to effective average and second, the image from each slit must be well-registered. Based on some of these complications it seems, given the current technology, the best operational mode is to use the sensor to increase area coverage.

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Available abstract

Preliminary testing of a three-slit prism-based spectrometer is presented to test means of exploiting data from a multi-slit spectrometer as well as some potential ways of dealing with complications that arise when using multiple slits. When using a multiple slit spectrometer to boost SNR there are two primary concerns: first, the spectral axis of each slit must be nearly identical to effective average and second, the image from each slit must be well-registered. Based on some of these complications it seems, given the current technology, the best operational mode is to use the sensor to increase area coverage.

Key concepts: Slit, Spectrometer, Optics, Prism, Imaging spectrometer, Computer science, Mode (computer interface), Physics

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