2016•ECS TransactionsOpen access
Time-Resolved Nanostructural Analysis of Thin-Film Formation Process from Nafion Solution by Synchrotron X-Ray Scattering
Yuichi Konosu, Hiroyasu Masunaga, Takaaki Hikima, Masatoshi Tokita, Hidetoshi Matsumoto, Takashi Sasabe, Toshihiko Yoshida, Kazuhiko Shinohara, Shuichiro Hirai
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Abstract
The dynamics of thin-film formation process from Nafion solution induced by solvent evaporation were investigated by in-situ time-resolved grazing-incidence small- and wide-angle X-ray scattering (GISAXS/GIWAXS) measurements utilizing synchrotron radiation. GISAXS/GIWAXS measurements revealed subnano- to nano-scaled structural development during thin-film formation process from Nafion solution. In the early stage, solvent evaporation decreased the distance between the scatter structures in Nafion solution. With the solvent evaporation, the ordered structures with a spacing of 3.3 nm appeared and finally solidified. In-situ time-resolved GISAXS/GIWAXS techniques provide a powerful tool to investigate the development of structures during thin-film formation process from polymer solutions including ionomer solution.
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